capacitance-voltage technique

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• Capacitance voltage profiling — The CV , or more correctly C V , in C V profiling, stands for capacitance voltage, and refers to a technique used for characterization of semiconductor materials and devices. The technique uses a metal semiconductor junction (Schottky barrier) or …   Wikipedia

• Voltage clamp — The voltage clamp is used by electrophysiologists to measure the ion currents across a neuronal membrane while holding the membrane voltage at a set level. Neuronal membranes contain many different kinds of ion channels, some of which are voltage …   Wikipedia

• Voltage divider — In electronics, a voltage divider (also known as a potential divider) is a simple linear circuit that produces an output voltage ( V out) that is a fraction of its input voltage ( V in). Voltage division refers to the partitioning of a voltage… …   Wikipedia

• Voltage-to-current converter — Introduction For a variety of reasons, in low voltage electronics, voltage is a more frequently used data carrier. Thus electronic devices tend to be labeled with voltage inputs and outputs. However some devices are labeled in terms of current… …   Wikipedia

• Drive Level Capacitance Profiling — (DLCP) is a type of capacitance voltage profiling characterization technique developed specifically for amorphous and polycrystalline materials which have more anomalies such as deep levels, interface states, or nonuniformities. Whereas in… …   Wikipedia

• Dynamic voltage scaling — is a power management technique in computer architecture, where the voltage used in a component is increased or decreased, depending upon circumstances. Dynamic voltage scaling to increase voltage is known as overvolting; dynamic voltage scaling… …   Wikipedia

• High-voltage direct current — HVDC or high voltage, direct current electric power transmission systems contrast with the more common alternating current systems as a means for the bulk transmission of electrical power. The modern form of HVDC transmission uses technology… …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are …   Wikipedia

• Vacuum tube — This article is about the electronic device. For experiments in an evacuated pipe, see free fall. For the transport system, see pneumatic tube. Modern vacuum tubes, mostly miniature style In electronics, a vacuum tube, electron tube (in North… …   Wikipedia

• Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… …   Wikipedia